Toward Security Closure in the Face of Reliability Effects

Authors: J. Lienig, S. Rothe, M. Thiele, N. Rangarajan, M. Ashraf, M. Nabeel, H. Amrouch, O. Sinanoglu, J. Knechtel

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (ICCAD), pp. 1-9; Nov. 2021