News
Samah Saeed won the TTTC Best Doctoral Thesis Award
This award is given every year to one graduating PhD student in the VLSI Testing community for the quality and impact of their research. The judges are from both industry and academia, where each is represented 50%. Samah had won the semi-final compatition at the VLSI Test Sympoisum in Napa in April 2014 to represent the North America Continent in the final. In October in Seattle, the final competition was held at International Test Conference, and Samah won!
Our research on IC camouflaging in The National
Our research on IC camouflaging is featured in an article titled “Confusion is the name of the game in outwitting microchip reverse engineers” in The National.
Best Student Paper Award at ACM Conference on Computer and Communications Security 2013
“Security Analysis of Integrated Circuit Camouflaging”, received the Best Student Paper Award at ACM Conference on Computer and Communications Security, Berlin, Germany, Nov 2013. ACM CCS is the number #1 conference in cybersecurity.
US National Science Foundation provides $500K funding for our research on hardware security
US National Science Foundation provides $500K funding for our research on hardware security, focusing in particular on the development of quantifiable security metrics for techniques such us logic encryption and split manufacturing. This a joint project with Prof. Ramesh Karri’s (co-PI) group at the Polytechnic Institute of NYU.
SRC/ATIC provides $180K funding for our research on hardware security
SRC/ATIC provides $180K funding (matched 1:1 by NYUAD) for our research on hardware security, focusing in particular on the design-for-trust efforts in the context of low-power SOCs. Semiconductor Research Corporation is establishing a research center in the UAE with the funding provided by UAE’s Advanced Technology Investment Company. One of the funded tasks under this center is our project on hardware security.
Samah Saeed received the “Pearl Brownstein Doctoral Research Award” from the CSE Department of NYU Tandon
Samah Saeed received the “Pearl Brownstein Doctoral Research Award” from the CSE Department of NYU-Poly. Each year, a set of highly coveted awards are provided to students, in particular, graduating seniors and graduate students to recognize outstanding academic achievement, service, leadership, and contributions within the NYU-Poly community. Established in 1987 and given in loving memory of her son, Joseph, to PhD students in the Department of Computer Science and Engineering whose doctoral research shows the greatest promise. Samah will receive her award in the Commencement Awards Ceremony on May 20, 2013.
SRC/ATIC provides $200K funding for our research on Adaptive Testing of Electronic Chips
SRC/ATIC provides $200K funding for our research on Adaptive Testing of Electronic Chips. Semiconductor Research Corporation channels the funding provided by UAE’s Advanced Technology Investment Company to local universities in the UAE. We are pleased to be one of the few recipients this year, and are thankful to SRC and ATIC for the support they are providing for our research on adaptive testing of chips. PhD student Chandra Suresh will be working on this project.
Ph.D. Student Sachhidh Kannan received the prestigious Great Minds Internship Award at the IBM Zurich Research Center
Ph.D. Student Sachhidh Kannan received the prestigious Great Minds Internship Award at the IBM Zurich Research Center. The Great Minds initiative is a competition for 3 to 6-month internships at IBM Research in Zurich for students from central and Eastern Europe, the Middle East and Africa. It provides students with the unique opportunity to work alongside world-class scientists in the leading industrial IT research organization. This is the first year that a candidate from the Middle East is accepted in this prestigious internship with IBM Research. Sachhidh plans to spend his summer and fall this year in Zurich.
VLSI Test Symposium 2011 Best Paper Award received by Samah Saeed and Ozgur Sinanoglu
VLSI Test Symposium 2011 Best Paper Award received by Samah Saeed and Ozgur Sinanoglu. VLSI Test Symposium is one of the top research conference in the area of Electronic Testing. The title of the award-winning paper is “Expedited Response Compaction for Scan Power Reduction”. The paper outlines a technique that helps control power dissipation in an electronic chip during its post-manufacturing test.