VLSI Test Symposium 2011 Best Paper Award received by Samah Saeed and Ozgur Sinanoglu

VLSI Test Symposium 2011 Best Paper Award received by Samah Saeed and Ozgur Sinanoglu. VLSI Test Symposium is one of the top research conference in the area of Electronic Testing. The title of the award-winning paper is “Expedited Response Compaction for Scan Power Reduction”. The paper outlines a technique that helps control power dissipation in an electronic chip during its post-manufacturing test.